On Mon, Nov 22, 2010 at 08:41:59PM +0800, Sergei Shtylyov wrote:
quoted text
> Hello.
> 
> On 22-11-2010 7:02, Luo Andy wrote:
> 
> > This patch adds test mode support for Langwell gadget driver.
> 
> > Signed-off-by: Henry Yuan<hang.yuan@intel.com>
> > Signed-off-by: Andy Luo<yifei.luo@intel.com>
> [...]
> 
> > diff --git a/include/linux/usb/langwell_udc.h b/include/linux/usb/langwell_udc.h
> > index 2d2d1bb..deeaabf 100644
> > --- a/include/linux/usb/langwell_udc.h
> > +++ b/include/linux/usb/langwell_udc.h
> > @@ -178,6 +178,11 @@ struct langwell_op_regs {
> >   #define	PORTS_WKDS	BIT(21)	/* wake on disconnect enable */
> >   #define	PORTS_WKCN	BIT(20)	/* wake on connect enable */
> >   #define	PORTS_PTC(p)	(((p)>>16)&0xf)	/* bits 19:16, port test control */
> > +#define	TEST_J		1
> > +#define	TEST_K		2
> > +#define	TEST_SE0_NAK	3
> > +#define	TEST_PACKET	4
> > +#define	TEST_FORCE_EN	5
> 
>     There is nothing Langwell specific in these constants, so they should be 
> in some generic USB header.

Actually I was thinking about adding the macros to "ch9.h", but I saw some 
other implementation of test mode using their own headers. Anyway I will 
move them to generic header "ch9.h". 

Thanks,
Andy
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