Mark Lord wrote:As a long time kernel tester, I see some problem with the newer "new development model". In the short merge windows, after to much time, there are to many patches. So there are problem to bisect bugs, and to have attention of developers. My impression is that in a week there are many more messages in lkml and to much bugs to be handled in these few days. I've two proposal: - better patch quality. I would like that every commit would compile. So an automatic commit test and public blames could increase the quality of first commits. [bisecting with non compilable point it is not a trivial task] - a slow down the patch inclusion on the merge windows (aka: not to much big changes in the first days). As tester I prefer that some big changes would be included in a "secondary window" (pre o rc release), in an other period as the big patch rush. ciao cate -
| Greg Kroah-Hartman | [PATCH 001/196] Chinese: Add the known_regression URI to the HOWTO |
| Linus Torvalds | Re: Dual-Licensing Linux Kernel with GPL V2 and GPL V3 |
| Eric Paris | [RFC 0/5] [TALPA] Intro to a linux interface for on access scanning |
| Ingo Molnar | Re: [patch 00/13] Syslets, "Threadlets", generic AIO support, v3 |
git: | |
| Gerrit Renker | [PATCH 18/37] dccp: Support for Mandatory options |
| David Miller | [GIT]: Networking |
| David Miller | Re: [PATCH] pkt_sched: Destroy gen estimators under rtnl_lock(). |
| Andrew Morton | Re: [BUG] New Kernel Bugs |
